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Field Emission Scanning Electron Microscope |
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The
Hitachi S-800 Field Emission Scanning Electron Microscope (FESEM), is the
latest acquisition of the Material & Metallurgical and Engineering
Department at NMT, as initiative to increase the nanomaterials
researching capability in the department.
The S-800 FESEM is a powerful tool with a high theorical resolution of 2 nm (20 Ao ) loaded with PGT X-ray detector and EBSD system. The microscope is computer-controlled with SPIRIT software under user-friendly windows operating system. Images can be saved in digital format and can be transferred to any location using standard procedures.
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