Analytical Capabilities
| Make and Model | Description | Contact Person |
| Brookhaven Instruments BI-HV | Light scatterer | Paul Fuierer |
| Cambridge Stereoscan 90 | Scanning electron microscope | Eric Krosche |
| Carver 2518 | Laboratory hot press | John McCoy |
| CS Corp Mini-coater | Sputter coater | Eric Krosche |
| Denton Vacuum DV-502 | Vacuum evaporator | Eric Krosche |
| Digital Instruments Multimode AFM-2 | Scanning probe microscope | Paul Fuierer |
| EMITECH K950X | Carbon evaporator/Sputter coater | Eric Krosche |
| Haake RD 500 | Rheodrive with Rheomix extruder | John McCoy |
| Hewlitt-Packard 4192A | Low frequency impedance analyzer | Paul Fuierer |
| Hewlitt-Packard 4291A | Radio frequency impedance/material analyzer | Paul Fuierer |
| Hitachi S-800 | Field emission scanning electron microscope | Eric Krosche |
| Instron 1122 | Mechanical universal testing - variety of load cells available | Osman Inal |
| Instron 3211 | Capillary rheometer | John McCoy |
| JEOL JSM-6100 | Scanning electron microscope | Eric Krosche |
| JEOL 100C | Transmission electron microscope | Eric Krosche |
| Linseis L81 | Differential thermal analyzer - DTA/TGA from RT-1500 oC | Deidre Hirschfeld |
| Linseis L75 | Dilatometer RT- 1500 oC | Deidre Hirschfeld |
| Metco 12E | Wire flame spray system | Deidre Hirschfeld |
| Metricon 2010 | Prism coupler | Paul Fuierer |
| MPM | Screen printer 4" square | Deidre Hirschfeld |
| MTS 858 Mini Bionix II | Axial/torsional servohydraulic testing machine | Bhaskar Majumdar |
| Perkin Elmer 4300 | Scanning Auger microprobe | Eric Krosche |
| Perkin Elmer DSC 7 | Differential scanning calorimeter | John McCoy |
| Phillips 430 | Transmission electron microscope | Gillian Bond |
| Plasmadyne/Metco 3600/SG100 | Plasma spray system with manipulator | Deidre Hirschfeld |
| Radiant Technologies Precision LC | Ferroelectric materials analyzer | Paul Fuierer |
| Rheometric Scientific SR5 | Rotational rheometer to 150 oC | John McCoy |
| Rheometrics RMS 800E | Mechanical spectrometer | John McCoy |
| Siemens D500 | X-ray diffractometer | Eric Krosche |
| Thermal Technology Astro | High Temperature furnace to 2000 oC | Deidre Hirschfeld |
| Veeco Dektak 3 | Profilometer | Deidre Hirschfeld |
| Stanford Research Systems QMS200 | Atmospheric pressure gas analysis system | Deidre Hirschfeld |
| Stanford Research Systems RGA100 | Residual gas analyzer | Deidre Hirschfeld |
Other Equipment:
Uniaxial Hot Press to 1600 oC
Variety of CVD and PVD Units
Tape Caster
Optical Microscopes
Micro Hardness Testers
Polishing and Sample Preparation
Charpy Impact Testing
Variety of Furnaces to 2000 oC (Bottom Loading, Tube, and Box)